杜佩之: Taking Photos of Dark Matter: Detecting Dark Matter with Semiconductors
发布日期:2025-07-07  字号:   【打印

报告时间:2025年7月10日(星期四)15:00-16:30

报告地点:翡翠湖校区科教楼A座309室

杜佩之 研究员

工作单位中国科学技术大学

举办单位:物理学院

报告简介

Dark matter remains one of the most profound mysteries in fundamental physics, with extensive efforts underway to detect it. In this talk, I will highlight recent progress in dark matter direct detection with semiconductors. Current experiments leverage CCDs to detect potential dark matter signals but face challenges from unexplored background sources. I will discuss the origins of these backgrounds and introduce our new proposed device, the Dual-sided CCD (DCCD), designed to significantly reduce these limitations and enhance detection sensitivity. Furthermore, I will demonstrate doped semiconductors and the infrared detectors on the James Webb Space Telescope can explore previously inaccessible regions of the dark matter parameter space.

报告人简介

杜佩之,特任研究员,入选中科院人才青年项目。2019年博士毕业于美国马里兰大学,2025年加入中国科学技术大学。长期致力于粒子物理唯象理论研究,关注超越标准模型的新物理,包括暗物质的直接探测以及天体物理和宇宙学观测中寻找新物理。相关研究成果发表在Physical Review Letters, Physical Review X, Nature Commun., Journal of High Energy Physics, Physical Review D 等国际重要学术期刊。